1. (Invited) Advanced Semiconductor Devices for Future CMOS Technologies. (27th March 2015) Authors: Claeys, Cor; Chiappe, Danielle; Collaert, Nadine; Mitard, Jerome; Radu, Juliana; Rooyackers, Rita; Simoen, Eddy; Vandooren, Anne; Veloso, Anabela; Waldron, Niamh; Witters, Liesbeth; Thean, Aaron Journal: ECS transactions Issue: Volume 66:Number 5(2015) Page Start: 49 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. (Invited) Electrical Activity of Extended Defects in III-V Semiconductors. (3rd July 2019) Authors: Simoen, Eddy Roger; Hsu, P.-C.; Mols, Yves; Kunert, Bernardette; Langer, Robert; Merckling, Clement; Alian, AliReza; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Claeys, Cor Journal: ECS transactions Issue: Volume 92:Number 4(2019) Page Start: 21 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. (Invited) Generation-Recombination Noise in Advanced CMOS Devices. (19th August 2016) Authors: Simoen, Eddy; Oliveira, Alberto Vinícius de; Boudier, Dimitri; Mitard, Jerome; Witters, Liesbeth; Veloso, Anabela; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Carin, Regis; Cretu, Bogdan; Langer, Robert; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 75:Number 5(2016) Page Start: 111 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. (Invited) Impact of the Metal Gate on the Oxide Stack Quality Assessed by Low-Frequency Noise. (1st August 2017) Authors: Simoen, Eddy; He, Liang; O'Sullivan, Barry; Veloso, Anabela; Horiguchi, Naoto; Collaert, Nadine; Claeys, Cor Journal: ECS transactions Issue: Volume 80:Number 4(2017) Page Start: 69 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. (Invited) On the Electrical Activity of Extended Defects in High-Mobility Channel Materials. (14th September 2015) Authors: Simoen, Eddy; Eneman, Geert; Hikavyy, Andriy Yakovitch; Loo, Roger; Gupta, Somya; Merckling, Clement; Alian, AliReza; Schulze, Andreas; Caymax, Matty; Langer, Robert; Barla, Kathy; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 10(2015) Page Start: 119 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. (Invited) The Assessment of Border Traps in High-Mobility Channel Materials. (8th September 2015) Authors: Simoen, Eddy; Alian, AliReza; Arimura, Hiroaki; Lin, D; Mertens, Hans; Mitard, Jerome; Sioncke, Sonia; Fang, Wen; Luo, Jun; Zhao, Chao; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; Claeys, Cor Journal: ECS transactions Issue: Volume 69:Number 5(2015) Page Start: 205 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Analog performance of vertical nanowire TFETs as a function of temperature and transport mechanism. (October 2015) Authors: Martino, Marcio Dalla Valle; Neves, Felipe; Ghedini Der Agopian, Paula; Martino, João Antonio; Vandooren, Anne; Rooyackers, Rita; Simoen, Eddy; Thean, Aaron; Claeys, Cor Journal: Solid-state electronics Issue: Volume 112(2015) Page Start: 51 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Analysis of proton irradiated n- and p-type strained FinFETs at low temperatures down to 100 K. (25th April 2018) Authors: Caparroz, Luis Felipe Vicentis; Bordallo, Caio Cesar Mendes; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Der Agopian, Paula Ghedini Journal: Semiconductor science and technology Issue: Volume 33:Number 6(2018:Jun.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures. (September 2016) Authors: Oliveira, Alberto Vinicius de; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron Journal: Solid-state electronics Issue: Volume 123(2016) Page Start: 124 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Comparative analysis of the intrinsic voltage gain and unit gain frequency between SOI and bulk FinFETs up to high temperatures. (September 2016) Authors: Oliveira, Alberto Vinicius de; Agopian, Paula Ghedini Der; Martino, Joao Antonio; Simoen, Eddy; Claeys, Cor; Collaert, Nadine; Thean, Aaron Journal: Solid-state electronics Issue: Volume 123(2016) Page Start: 124 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗