1. Are Extended Defects a Show Stopper for Future III-V CMOS Technologies. (May 2019) Authors: Claeys, C; Hsu, P-C; He, L; Mols, Y; Langer, R; Waldron, N; Eneman, G; Collaert, N; Heyns, M; Simoen, E Journal: Journal of physics Issue: Volume 1190(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Analog parameters of solid source Zn diffusion InXGa1−XAs nTFETs down to 10 K. (28th October 2016) Authors: Bordallo, C; Martino, J A; Agopian, P G D; Alian, A; Mols, Y; Rooyackers, R; Vandooren, A; Verhulst, A S; Smets, Q; Simoen, E; Claeys, C; Collaert, N Journal: Semiconductor science and technology Issue: Volume 31:Number 12(2016:Dec.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Performance of differential pair circuits designed with line tunnel FET devices at different temperatures. (6th June 2018) Authors: Martino, M D V; Martino, J A; Agopian, P G D; Rooyackers, R; Simoen, E; Collaert, N; Claeys, C Journal: Semiconductor science and technology Issue: Volume 33:Number 7(2018:Jul.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. P542 Efficacy and safety of biological therapies in chronic antibiotic-refractory pouchitis: a retrospective single-centre experience. (25th January 2019) Authors: Verstockt, B; Claeys, C; Van Assche, G; D'Hoore, A; Wolthuis, A; Vermeire, S; Ferrante, M Journal: Journal of Crohn's and colitis Issue: Volume 13(2019)Supplement 1 Page Start: S385 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. P624 Vedolizumab can induce clinical remission in patients with chronic antibiotic-refractory pouchitis: A retrospective single-centre experience. (16th January 2018) Authors: Verstockt, B; Claeys, C; Van Assche, G; D'Hoore, A; Wolthuis, A; Vermeire, S; Ferrante, M Journal: Journal of Crohn's and colitis Issue: Volume 12:Number 1(2018:Jan.)Supplement 1 Page Start: S425 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Can we optimize the gate oxide quality of DRAM input/output pMOSFETs by a post-deposition treatment?. (14th December 2018) Authors: Simoen, E; O'Sullivan, B; Ritzenthaler, R; Dentoni-Litta, E; Schram, T; Horiguchi, N; Claeys, C Journal: Semiconductor science and technology Issue: Volume 34:Number 1(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Experimental validation of numerical structural dynamic models for metal plate joining techniques. (August 2018) Authors: Van Belle, L; Brandolisio, D; Deckers, E; Jonckheere, S; Claeys, C; Pluymers, B; Desmet, W Journal: Journal of vibration and control Issue: Volume 24:Number 15(2018) Page Start: 3348 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Performance of TFET and FinFET devices applied to current mirrors for different dimensions and temperatures. (11th March 2016) Authors: Martino, M D V; Martino, J A; Agopian, P G D; Vandooren, A; Rooyackers, R; Simoen, E; Thean, A; Claeys, C Journal: Semiconductor science and technology Issue: Volume 31:Number 5(2016:May) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Split CV mobility at low temperature operation of Ge pFinFETs fabricated with STI first and last processes. (13th October 2016) Authors: Oliveira, A V; Simoen, E; Agopian, P G D; Martino, J A; Mitard, J; Witters, L; Langer, R; Collaert, N; Thean, A; Claeys, C Journal: Semiconductor science and technology Issue: Volume 31:Number 11(2016:Nov.) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Analysis of current mirror circuits designed with line tunnel FET devices at different temperatures. (25th April 2017) Authors: Martino, M D V; Martino, J A; Agopian, P G D; Vandooren, A; Rooyackers, R; Simoen, E; Claeys, C Journal: Semiconductor science and technology Issue: Volume 32:Number 5(2017:May) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗