Cite
MLA Citation
Toshiaki Tanigaki et al.. “In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope.” Microscopy and microanalysis, vol. 25, n.d., pp. 54–55. http://access.bl.uk/ark:/81055/vdc_100145642757.0x00000e