Cite
APA Citation
Tanigaki, T., Akashi, T., Yoshida, T., Harada, K., Ishizuka, K., Ichimura, M., Murakami, Y., Mitsuishi, K., Tomioka, Y., Shindo, D., Yu, X., Tokura, Y., & Shinada, H. (n.d.). in-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope. Microscopy and microanalysis, 25, 54–55. http://access.bl.uk/ark:/81055/vdc_100145642757.0x00000e