In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope. (August 2019)

Record Type:
Journal Article
Title:
In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope. (August 2019)
Main Title:
In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope
Authors:
Tanigaki, Toshiaki
Akashi, Tetsuya
Yoshida, Takaho
Harada, Ken
Ishizuka, Kazuo
Ichimura, Masahiko
Murakami, Yasukazu
Mitsuishi, Kazutaka
Tomioka, Yasuhide
Shindo, Daisuke
Yu, Xiuzhen
Tokura, Yoshinori
Shinada, Hiroyuki
Abstract:
Is Part Of:
Microscopy and microanalysis. Volume 25:(2022)Supplement 2
Journal:
Microscopy and microanalysis
Issue:
Volume 25:(2022)Supplement 2
Issue Display:
Volume 25, Issue 2 (2019)
Year:
2019
Volume:
25
Issue:
2
Issue Sort Value:
2019-0025-0002-0000
Page Start:
54
Page End:
55
Publication Date:
2019-08
Subjects:
Microscopy -- Periodicals
Microchemistry -- Periodicals
502.82
Journal URLs:
https://academic.oup.com/mam ↗
http://journals.cambridge.org/action/displayJournal?jid=MAM ↗
http://link.springer.de/link/service/journals/10005/index.htm ↗
http://firstsearch.oclc.org ↗
DOI:
10.1017/S1431927619001004 ↗
Languages:
English
ISSNs:
1431-9276
Deposit Type:
Legaldeposit
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD Digital store
Ingest File:
20000.xml