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Tanigaki, T. et al. (n.d.). In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope. Microscopy and microanalysis. pp. 54-55. [Online].
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Tanigaki, T. et al. (n.d.). In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope. Microscopy and microanalysis. pp. 54-55. [Online].