Cite
MLA Citation
Sascha Sadewasser et al., editors. Kelvin probe force microscopy : from single charge detection to device characterization. Cham, Switzerland : Springer, 2018. http://access.bl.uk/ark:/81055/vdc_100073362013.0x000001
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Sascha Sadewasser et al., editors. Kelvin probe force microscopy : from single charge detection to device characterization. Cham, Switzerland : Springer, 2018. http://access.bl.uk/ark:/81055/vdc_100073362013.0x000001