Cite
APA Citation
Sadewasser, S., & Glatzel, T. (Eds.) (2018). Kelvin probe force microscopy : from single charge detection to device characterization. Cham, Switzerland : Springer. http://access.bl.uk/ark:/81055/vdc_100073362013.0x000001
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Sadewasser, S., & Glatzel, T. (Eds.) (2018). Kelvin probe force microscopy : from single charge detection to device characterization. Cham, Switzerland : Springer. http://access.bl.uk/ark:/81055/vdc_100073362013.0x000001