Kelvin probe force microscopy : from single charge detection to device characterization /: from single charge detection to device characterization. ([2018])

• Record Type: Book
• Further Information: Note: Sascha Sadewasser, Thilo Glatzel, editors.
• Editors: Sadewasser, Sascha; Glatzel, Thilo
• Contents: Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution.- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.
• Publisher Details: Cham, Switzerland : Springer
• Publication Date: 2018
• Extent: 1 online resource (XXIV, 521 pages), 234 illustrations, 194 illustrations in color
• Subjects: 502.8/2; Physics; Atomic force microscopy; Scanning probe microscopy; Electrostatics -- Measurement; SCIENCE -- General; Materials science; Measurement; Microscopy; Nanotechnology; Physical measurements; Physics; Spectrum analysis; Surfaces (Technology); Thin films; Technology & Engineering -- Material Science; Technology & Engineering -- Nanotechnology & MEMS; Science -- Weights & Measures; Materials science; Precision instruments manufacture; Testing of materials; Mensuration & systems of measurement; Surfaces (Physics); Engineering; Science -- Spectroscopy & Spectrum Analysis; Spectrum analysis, spectrochemistry, mass spectrometry; Electronic books
• Languages: English
• ISBNs: 9783319756875; 3319756877
• Related ISBNs: 9783319756868; 3319756869
• Notes: Note: Includes bibliographical references and index.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.