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HARVARD Citation
Lienig, J. et al. (2018) Fundamentals of electromigration-aware integrated circuit design. [Online]. Cham : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100073310209.0x000001
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Lienig, J. et al. (2018) Fundamentals of electromigration-aware integrated circuit design. [Online]. Cham : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100073310209.0x000001