Cite
APA Citation
Lienig, J., & (Engineer), T. (2018). Fundamentals of electromigration-aware integrated circuit design. Cham : Springer. http://access.bl.uk/ark:/81055/vdc_100073310209.0x000001
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Lienig, J., & (Engineer), T. (2018). Fundamentals of electromigration-aware integrated circuit design. Cham : Springer. http://access.bl.uk/ark:/81055/vdc_100073310209.0x000001