Cite
MLA Citation
Brajesh Kumar Kaushik et al., editors. VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. Singapore : Springer, 2017. http://access.bl.uk/ark:/81055/vdc_100069476996.0x000001