Cite
HARVARD Citation
Kaushik, B. et al. (eds.) (2017) VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. [Online]. Singapore : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100069476996.0x000001