Cite
APA Citation
Kaushik, B. K., Dasgupta, S., & Singh, V. (Eds.) (2017). VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. Singapore : Springer. http://access.bl.uk/ark:/81055/vdc_100069476996.0x000001