1. BS EN 60747-16-8 Ed.1.0. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters (22nd December 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. BS EN 60747-16-8. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters (5th March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. BS EN 63378-3. Thermal standardization on semiconductor packages. Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis (24th January 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS EN IEC 60747-5-16. Semiconductor devices. Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the photocurrent spectroscopy (7th December 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. BS EN IEC 62899-203. Printed electronics. Part 203. Materials. Semiconductor ink (23rd July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory (21st August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. BS IEC 60747-18-4. Semiconductor devices. Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors (7th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. BS IEC 63287-2 Ed.1.0. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile (9th February 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Semiconductor devices - Mechanical and climatic test methods. Guidelines for IC reliability qualification plans Part 43, (22nd September 2017) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (44 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for stretchability, flexibility, and stability of flexible resistive memory Part 8, (24th January 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗