BS IEC 63287-2 Ed.1.0. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile (9th February 2021)

Record Type:: Book
Title:: BS IEC 63287-2 Ed.1.0. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile (9th February 2021)
Main Title:: BS IEC 63287-2 Ed.1.0. Semiconductor devices. Guidelines for reliability qualification plans.
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2021
Extent:: 1 online resource (16 pages)
Subjects:: 602.1841
Doping (semiconductors)
Electrical equipment
Semiconductor materials
Semiconductor switches
Semiconductor technology
Languages:: English
ISSNs:: 3042-7709
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.595787
Ingest File:: 04_065.xml