81. A feasibility study on potential of stress sensors to detect solder joint defects toward prognostics of power modules. (October 2022) Authors: Usui, Masanori; Kuwahara, Makoto; Satoh, Toshikazu Journal: Microelectronics and reliability Issue: Volume 137(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
82. A fully digital feedback control of gate driver for current balancing of parallel connected power devices. (September 2018) Authors: Tripathi, R.N.; Tsukuda, M.; Omura, I. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 505 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
83. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016) Authors: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 320 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
84. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016) Authors: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 320 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
85. A general approach for degradation modeling to enable a widespread use of aging simulations in IC design. (October 2022) Authors: Lange, André; Gonzalez, Fabio A. Velarde; Giering, Kay-Uwe; Vervantidis, Anastasios; Hahne, Lukas; Heinig, Andy; Jancke, Roland Journal: Microelectronics and reliability Issue: Volume 137(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
86. A general defect modelling and simulation-assisted approach for fault isolation in failure analysis. (December 2022) Authors: Li, Ang; Bian, Haijiao; Liu, Binghai; Li, Yao; Zhao, Yiqiang Journal: Microelectronics and reliability Issue: Volume 139(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
87. A generalized degradation model based on Gaussian process. (June 2018) Authors: Wang, Zhihua; Wu, Qiong; Zhang, Xiongjian; Wen, Xinlei; Zhang, Yongbo; Liu, Chengrui; Fu, Huimin Journal: Microelectronics and reliability Issue: Volume 85(2018) Page Start: 207 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
88. A health state prediction method of traction converter IGBT based on optimized particle filter. (December 2022) Authors: Shi, Yunming; Ai, Yu; Chen, Shaoyong; Zhang, Chenyang; Liu, Jianqiang Journal: Microelectronics and reliability Issue: Volume 139(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
89. A high fault coverage test approach for communication channels in network on chip. (August 2017) Authors: Aghaei, Babak Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 178 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
90. A high-efficiency aging test with new data processing method for semiconductor device. (April 2023) Authors: Yang, Xinhuan; Sang, Qianqian; Zhang, Jianyu; Wang, Chuanzheng; Yu, Mingyan; Zhao, Yuanfu Journal: Microelectronics and reliability Issue: Volume 143(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗