61. A data-driven method for anomaly detection and aging model parameter estimation of capacitors based on condition monitoring. (November 2022) Authors: Lv, Chunlin; Liu, Jinjun; Zhang, Yan Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
62. A data-driven photovoltaic string current mismatch fault diagnosis method based on I-V curve. (November 2022) Authors: Zhang, Zhixiang; Ma, Mingyao; Ma, Wenting; Zhang, Rui; Wang, Jun Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
63. A deep learning-based recognition method for degradation monitoring of ball screw with multi-sensor data fusion. (August 2017) Authors: Zhang, Li; Gao, Hongli; Wen, Juan; Li, Shichao; Liu, Qi Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 215 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
64. A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. (September 2018) Authors: Medeiros, G.C.; Bolzani Poehls, L.M.; Taouil, M.; Luis Vargas, F.; Hamdioui, S. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 355 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
65. A degradation model for separable electrical contacts based on the failure caused by surface oxide film. (December 2022) Authors: Zhong, Liqiang; Fan, Xing; Han, Kunkun; Chen, Wenhua; Qian, Ping Journal: Microelectronics and reliability Issue: Volume 139(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
66. A design and qualification of LED flip Chip-on-Board module with tunable color temperatures. (May 2018) Authors: Fan, Jiajie; Cao, Jianwu; Yu, Chaohua; Qian, Cheng; Fan, Xuejun; Zhang, Guoqi Journal: Microelectronics and reliability Issue: Volume 84(2018) Page Start: 140 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
67. A distributed minority and majority voting based redundancy scheme. Issue 9 (August 2015) Authors: Balasubramanian, P.; Maskell, D.L. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1373 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
68. A double snapback SCR ESD protection scheme for 28 nm CMOS process. (May 2018) Authors: Hu, Tao; Dong, Shurong; Jin, Hao; Wong, Hei; Xu, Zekun; Li, Xiang; Liou, Juin J. Journal: Microelectronics and reliability Issue: Volume 84(2018) Page Start: 20 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
69. A dual-rail compact defect-tolerant multiplexer. Issue 3 (February 2015) Authors: Ben Dhia, A.; Slimani, M.; Cai, H.; de B. Naviner, L.A. Journal: Microelectronics and reliability Issue: Volume 55:Issue 3/4(2015) Page Start: 662 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
70. A dynamic partial reconfigurable system with combined task allocation method to improve the reliability of FPGA. (April 2018) Authors: Wang, Guohua; Liu, Song; Sun, Jiangtao Journal: Microelectronics and reliability Issue: Volume 83(2018) Page Start: 14 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗