741. Characterization and optimization of junctionless gate-all-around vertically stacked nanowire FETs for sub-5 nm technology nodes. (October 2021) Authors: Sreenivasulu, V. Bharath; Narendar, Vadthiya Journal: Microelectronics journal Issue: Volume 116(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
742. Characterization of embedded microheater of a CMOS–MEMS gravimetric sensor device. (September 2016) Authors: Dennis, John Ojur; Rabih, Almur A.S.; Md Khir, Mohd Haris; Ahmed, Abdelaziz Yousif; Ahmed, Mawahib Gafare; Mian, Muhammad Umer Journal: Microelectronics journal Issue: Volume 55(2016) Page Start: 179 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
743. Characterization of embedded microheater of a CMOS–MEMS gravimetric sensor device. (September 2016) Authors: Dennis, John Ojur; Rabih, Almur A.S.; Md Khir, Mohd Haris; Ahmed, Abdelaziz Yousif; Ahmed, Mawahib Gafare; Mian, Muhammad Umer Journal: Microelectronics journal Issue: Volume 55(2016) Page Start: 179 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
744. Characterization of phase change material systems using a thermal test device. Issue 12 (December 2015) Authors: Jordà, Xavier; Esarte, Jesús; Perpiñà, Xavier; Vellvehi, Miquel; Argandoña, Gorka; Aresti, Maite Journal: Microelectronics journal Issue: Volume 46:Issue 12 Part A (2015) Page Start: 1195 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
745. Charge pumping test technique using CMOS ring oscillator on leakage issue. (October 2017) Authors: Liu, Yongbo; Zhu, Zhengyong; Zhu, Huilong; Wan, Guangxing; Li, Junfeng; Zhao, Chao Journal: Microelectronics journal Issue: Volume 68(2017) Page Start: 40 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
746. CharTM: The dynamic stability characterization for memory based on tail distribution modeling. (March 2023) Authors: Pang, Liang; Yao, Mengyun; Shi, Xiao; Yan, Hao; Shi, Longxin Journal: Microelectronics journal Issue: Volume 133(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
747. Chip implementation of supervised neural network using single-transistor synapses. (August 2017) Authors: Jeng, E.S.; Chou, S.W.; Chen, H.X.; Chiang, Y.L. Journal: Microelectronics journal Issue: Volume 66(2017) Page Start: 76 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
748. Circuit optimization technique of nonvolatile logic-in-memory based lookup table circuits using magnetic tunnel junction devices. (January 2019) Authors: Suzuki, Daisuke; Oka, Takahiro; Hanyu, Takahiro Journal: Microelectronics journal Issue: Volume 83(2019) Page Start: 39 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
749. Circuit reliability estimation based on an iterative PTM model with hybrid coding. (June 2016) Authors: Xiao, Jie; Lee, William; Jiang, Jianhui; Yang, Xuhua Journal: Microelectronics journal Issue: Volume 52(2016) Page Start: 117 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
750. Class-AB CMOS output stages suitable for low-voltage amplifiers in nanometer technologies. (October 2019) Authors: Giustolisi, Gianluca; Palumbo, Gaetano; Pennisi, Salvatore Journal: Microelectronics journal Issue: Volume 92(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗