Characterization of phase change material systems using a thermal test device. Issue 12 (December 2015)

• Record Type: Journal Article
• Authors: Jordà, Xavier; Esarte, Jesús; Perpiñà, Xavier; Vellvehi, Miquel; Argandoña, Gorka; Aresti, Maite
• Is Part Of: Microelectronics journal. Volume 46:Issue 12 Part A (2015)
• Page Start: 1195
• Page End: 1201
• Publication Date: 2015-12
• Subjects: Thermal characterization -- Phase change materials -- Thermal management -- Thermal test devices; Microelectronics -- Periodicals; Microélectronique -- Périodiques; Microelectronics; Electronic journals; Journals - contents and abstracts; Periodicals; 621.3805
• DOI: 10.1016/j.mejo.2015.09.022
• Languages: English
• ISSNs: 0959-8324

Abstract

Abstract: This work presents a thermal characterization approach for phase change materials thermal management systems (PCM-TMS) based on a thermal test device (TTD) allowing simultaneous dissipation and chip temperature measurement. The tests are oriented towards PCM-TMS characterization for their application in the power electronics domain, providing an insight to the physical phenomena involved in PCM systems. The PCM-TMS used in this work consists in a 35 mm diameter and 9.5 mm height Cu case, containing a 20 ppi porous Cu mesh and a 31 °C melting temperature paraffin. It has been demonstrated that the proposed characterization methodology is suitable for the assessment of this kind of non-linear systems, allowing an easy acquisition of both, heating and cooling transients.