1. Debug automation from pre-silicon to post-silicon. ([2014]) Authors: Dihbāshī, Mahdī; Fey, Görschwin Record Type: Book Extent: 1 online resource (xiv, 171 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Test generation of crosstalk delay faults in VLSI circuits. ([2019]) Authors: Jayanthy, S; Bhuvaneswari, M. C Record Type: Book Extent: 1 online resource (xi, 156 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Thermal-aware testing of digital VLSI circuits and systems. (2018) Authors: Chattopadhyay, Santanu Record Type: Book Extent: 1 online resource, illustrations (black and white) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers /: 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. (2017) Editors: Kaushik, Brajesh Kumar; Dasgupta, Sudeb; Singh, Virendra Other Names: VDAT (Symposium), 21st Record Type: Book Extent: 1 online resource (xxi, 815 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. VLSI design and test for systems dependability. ([2019]) Editors: Asai, Shojiro Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗