Thermal-aware testing of digital VLSI circuits and systems. (2018)
- Record Type:
- Book
- Title:
- Thermal-aware testing of digital VLSI circuits and systems. (2018)
- Main Title:
- Thermal-aware testing of digital VLSI circuits and systems
- Further Information:
- Note: Santanu Chattopadhyay.
- Authors:
- Chattopadhyay, Santanu
- Edition:
- 1st
- Publisher Details:
- Boca Raton : CRC Press
- Publication Date:
- 2018
- Extent:
- 1 online resource, illustrations (black and white)
- Subjects:
- 621.3950287
Integrated circuits -- Very large scale integration -- Testing
Digital integrated circuits -- Testing
Temperature measurements - Languages:
- English
- ISBNs:
- 9781351227766
9781351227780
9781351227773
9781351227759 - Related ISBNs:
- 9780815378822
- Notes:
- Note: Description based on CIP data; resource not viewed.
- Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.309335
- Ingest File:
- 01_236.xml