VLSI design and test for systems dependability. ([2019])

• Record Type: Book
• Further Information: Note: Shojiro Asai, editor.
• Editors: Asai, Shojiro
• Contents: Challenges and Opportunities in VLSI for Systems Dependability -- Design and Development of Electronic Systems for Quality and Dependability -- Radiation-Induced Soft Errors -- Electromagnetic Noises -- Variations in Device Characteristics -- Time-Dependent Degradation in Device Characteristics -- Connectivity in Wireless Telecommunications -- Connectivity in Electronic Packaging -- Responsiveness for Hard Real Time Control -- The Role of Security LSI and the Example of Malicious Attacks -- Verification and Test Coverage -- Unknown Threats and Provisions -- Design Automation for Reliability -- Formal Verification and Debugging of VLSI Logic Design for Systems Dependability:Experiments and Evaluation -- Virtualization: System-Level Fault Simulation of SRAM Errors in Automotive Electronic Control Systems -- DART – A Concept of In-Field Testing for Enhancing System De-pendability -- Design of SRAM Resilient against Dynamic Voltage Variations -- Design and Applications of Dependable Non-Volatile Memory Systems -- Network-on-Chip Based Multiple-Core Centrized ECUs for Safety-Critical Automotive Applications -- An On-Chip Router Architecture for Dependable Multicore Processor -- Wireless Interconnect in Electronic Systems -- Wireless Power Delivery Resilient against Loading Variations -- Extended Dependable Air: Use of Satellites in Boosting Dependability of PublicWireless Communications -- Responsive Multithreaded Processor for Hard Real-Time Robotic Applications -- A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme Using Simultaneously Copyable SRAM -- A 3D-VLSI Architecture for Future Automotive Visual Recognition -- Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space -- An FPGA Implementation of Comprehensive Security Functions for Systems-Level Authentication -- SRAM-Based Physically Unclonable Functions (PUFs) to Generate Signature out of Silicon for Authentication and Encryption.
• Publisher Details: Tokyo, Japan : Springer
• Publication Date: 2019
• Copyright Date: 2019
• Extent: 1 online resource
• Subjects: 621.39/5; Integrated circuits -- Very large scale integration -- Design and construction; Integrated circuits -- Very large scale integration -- Testing; TECHNOLOGY & ENGINEERING / Mechanical; Integrated circuits -- Very large scale integration -- Design and construction; Integrated circuits -- Very large scale integration -- Testing; Electronic books
• Languages: English
• ISBNs: 9784431565949; 4431565949
• Related ISBNs: 9784431565925; 4431565922
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (SpringerLink, viewed July 26, 2018).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.