41. Data requirements for semiconductor die. Particular requirements and recommendations for die types. Bare die Part 5-1, (15th July 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
42. Data requirements for semiconductor die. Particular requirements and recommendations for die types. Bare die with added connection structures Part 5-2, (15th June 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
43. Data requirements for semiconductor die. Specific requirements and recommendations. Electrical simulation Part 4-4, (15th March 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
44. Data requirements for semiconductor die. Specific requirements and recommendations. Handling and storage Part 4-2, (15th March 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
45. Data requirements for semiconductor die. Specific requirements and recommendations. Test and quality Part 4-1, (15th March 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
46. Data requirements for semiconductor die. Specific requirements and recommendations. Thermal Part 4-3, (15th March 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
47. Data requirements for semiconductor die. Vocabulary Part 2, (15th December 1999) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
48. Description of a parametrized European mini test chip. (15th September 1996) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
49. Description of the reliability test structures of the European mini test chip. (15th September 1996) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
50. Design and Verification of Low-Power Integrated Circuits. (30th April 2015) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (352 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗