Description of a parametrized European mini test chip. (15th September 1996)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1996
• Extent: 1 online resource (22 pages)
• Subjects: 602.1841; Test equipment; Reliability; Metal oxide semiconductors; Transistors; Electronic equipment and components; Microprocessor chips; Semiconductor devices; Digital integrated circuits; Assessed reliability; Computer applications; Integrated circuits
• Languages: English
• Related ISBNs: 0580261794
• ISSNs: 0082-4420
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.