Description of the reliability test structures of the European mini test chip. (15th September 1996)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1996
• Extent: 1 online resource (38 pages)
• Subjects: 602.1841; Computer applications; Modules; Dimensions; Digital integrated circuits; Assessed reliability; Semiconductor devices; Electronic equipment and components; Integrated circuits; Transistors; Systems analysis; Test equipment; Metal oxide semiconductors; Reliability; Failure (quality control); Microprocessor chips
• Languages: English
• Related ISBNs: 0580260372
• ISSNs: 0083-5677
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.