231. Semiconductor devices. Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature Part 14-11, (12th March 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
232. Semiconductor devices. Stress migration test standard. Copper stress migration test standard Part 1, (21st July 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (28 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
233. Simplified design of IC amplifiers. (1996) Other Names: Lenk, John D Record Type: Book Extent: 1 online resource (239 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
234. Sinusoidal oscillators and waveform generators using modern electronic circuit building blocks. ([2016]) Authors: Senani, Raj; Bhaskar, D. R; Singh, V. K; Sharma, R. K Record Type: Book Extent: 1 online resource (xxv, 622 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
235. Smart power integration. (2022) Authors: Shaker, Ahmed; Gontrand, Christian; Abouelatta, Mohamed Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
236. Specification for dimensions of semiconductor devices and integrated electronic circuits. (30th November 1965) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (270 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
237. Specification for full sequence automatic control systems used on gas-fired appliances. (30th April 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
238. Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits. (15th May 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
239. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits. (15th December 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
240. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits. (15th May 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (27 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗