Semiconductor devices. Stress migration test standard. Copper stress migration test standard Part 1, (21st July 2020)

Record Type:: Book
Title:: Semiconductor devices. Stress migration test standard. Copper stress migration test standard Part 1, (21st July 2020)
Main Title:: Semiconductor devices. Stress migration test standard.
Authors:: British Standards Institution,
Issue Display:: Part 1
Part:: 1
Issue Sort Value:: 0000-0000-0000-0001
Publisher Details:: London : British Standards Institution
Publication Date:: 2020
Extent:: 1 online resource (28 pages)
Subjects:: 602.1841
Electromechanical devices
Electronic equipment and components
Integrated circuits
Vocabulary
Terminology
Semiconductor devices
Semiconductor technology
Languages:: English
Related ISBNs:: 9780580858086
ISSNs:: 3029-7228
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.546327
Ingest File:: 03_160.xml