Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write static memories silicon monolithic circuits. (15th May 1987)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1987
• Extent: 1 online resource (18 pages)
• Subjects: 602.1841; Monolithic integrated circuits; Metal oxide semiconductors; Qualification approval; Circuits; Integrated memory circuits; Quality control; Semiconductor devices; Approval testing; Silicon; Detail specification; Specification (approval); Assessed quality; Direct-access storage; Quality assurance systems; Electronic equipment and components; Computer storage devices; Electronic storage; Statistical quality control; Digital circuits; Semiconductor storage; Integrated circuits
• Languages: English
• Related ISBNs: 0580356027
• ISSNs: 0017-1466
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.