41. Semiconductor devices. Mechanical and climatic test methods. Resistance to soldering temperature for through-hole mounted devices Part 15, (1st October 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
42. Semiconductor devices. Mechanical and climatic test methods. Salt atmosphere Part 13, (30th April 2018) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
43. Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test Part 5, (18th June 2003) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
44. Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency Part 12, (18th April 2018) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
45. Shell boilers. Inspection during construction, documentation and marking of pressure parts of the boiler Part 5, (23rd March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
46. Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V. Ageing test and destruction test Part 2, (15th March 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
47. Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V. Ageing test and destruction test Part 2, (15th September 1996) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
48. Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1000 V. Ageing test, self-healing test and destruction test Part 2, (15th March 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
49. Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1000 V. Ageing test, self-healing test and destruction test Part 2, (15th October 1996) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
50. Specification for capacitors for use in tubular fluorescent and other discharge lamp circuits. General and safety requirements. (15th July 1999) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗