Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency Part 12, (18th April 2018)

Record Type:: Book
Title:: Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency Part 12, (18th April 2018)
Main Title:: Semiconductor devices. Mechanical and climatic test methods.
Authors:: British Standards Institution,
Issue Display:: Part 12
Part:: 12
Issue Sort Value:: 0000-0000-0000-0012
Publisher Details:: London : British Standards Institution
Publication Date:: 2018
Extent:: 1 online resource (12 pages)
Subjects:: 602.1841
Climate
Frequencies
Mechanical testing
Electronic equipment and components
Environmental testing
Vibration testing
Destructive testing
Integrated circuits
Semiconductor devices
Variable
Languages:: English
Related ISBNs:: 9780580986826
ISSNs:: 3036-1274
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.746316
Ingest File:: 16_008.xml