1. BS EN 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators (5th March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. BS EN 60747-16-8 Ed.1.0. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters (22nd December 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. BS EN 60747-16-8. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters (5th March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS EN 63150-3 Ed.1.0. Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment. Part 3. Human foot impact motion (29th March 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (25 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. BS EN 63378-3. Thermal standardization on semiconductor packages. Part 3. Thermal circuit simulation models of semiconductor packages for transient analysis (24th January 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. BS EN IEC 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators (18th December 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (39 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold (5th June 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory (21st August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate. (17th October 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. BS IEC 60747-18-4. Semiconductor devices. Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors (7th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗