BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate. (17th October 2019)

Record Type:
Book
Title:
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate. (17th October 2019)
Main Title:
BS EN IEC 63229. Semiconductor devices. The classification of defects in gallium nitride epitaxial film on silicon carbide substrate.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2019
Extent:
1 online resource (23 pages)
Subjects:
602.1841
Substrates (insulating)
Electrical equipment
Computer hardware
Components
Electrical components
Computer components
Common terms
Electronic equipment and components
Semiconductor technology
Languages:
English
ISSNs:
3040-4655
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:
British Library HMNTS - ELD.DS.541215
Ingest File:
03_150.xml