BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold (5th June 2020)

Record Type:
Book
Title:
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices. Part 40. Test methods of Micro-electromechanical inertial shock switch threshold (5th June 2020)
Main Title:
BS EN IEC 62047-40. Semiconductor devices. Micro-electromechanical devices.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (11 pages)
Subjects:
602.1841
Electronic equipment and components
Integrated circuits
Semiconductor devices
Semiconductor technology
Electromechanical devices
Test methods
Languages:
English
ISSNs:
3040-5217
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:
British Library HMNTS - ELD.DS.545337
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03_158.xml