Is Part Of: Microelectronics and reliability. Volume 95(2019) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 95(2019)

1. A mechanistic model of damage evolution in lead free solder joints under combinations of vibration and thermal cycling with varying amplitudes. (April 2019)

Authors:: Borgesen, P.; Wentlent, L.; Alghoul, T.; Sivasubramony, R.; Yadav, M.; Thekkut, S.; Cuevas, J.L. Then; Greene, C.
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 65
Record Type:: Journal Article
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2. Comparison of fatigue life prediction methods for solder joints under random vibration loading. (April 2019)

Authors:: Xia, Jiang; Yang, Lin; Liu, Qunxing; Peng, Qi; Cheng, LanXian; Li, GuoYuan
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 58
Record Type:: Journal Article
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3. Dual-axis rotary platform with UAV image recognition and tracking. (April 2019)

Authors:: Sheu, Bor-Horng; Chiu, Chih-Cheng; Lu, Wei-Ting; Lien, Chun-Chieh; Liu, Tung-Kuan; Chen, Wen-Ping
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 8
Record Type:: Journal Article
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4. Early SEU sensitivity assessment for collaborative hardening techniques: A case study of OPTOS processing architecture. (April 2019)

Authors:: Martín-Ortega, Alberto; Portela-García, Marta; de Mingo, José R.; Rodríguez, Santiago; Rivas, Joaquín; López-Buedo, Sergio; López-Ongil, Celia
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 36
Record Type:: Journal Article
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5. Editorial Board. (April 2019)

Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: ii
Record Type:: Journal Article
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6. Effects of total ionizing dose on single event effect sensitivity of FRAMs. (April 2019)

Authors:: Ji, Qinggang; Liu, Jie; Li, Dongqing; Liu, Tianqi; Ye, Bing; Zhao, Peixiong; Sun, Youmei
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 1
Record Type:: Journal Article
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7. Lateral charge spreading and device-to-device coupling in C-doped AlGaN/GaN-on-Si wafers. (April 2019)

Authors:: Singh, Manikant; Karboyan, Serge; Uren, Michael J.; Lee, Kean Boon; Zaidi, Zaffar; Houston, Peter A.; Kuball, Martin
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 81
Record Type:: Journal Article
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8. Numerical study on the self-heating effects for vacuum/high-k gate dielectric tri-gate FinFETs. (April 2019)

Authors:: Zhang, Guohe; Lai, Junhua; Zhu, Shengli; Wei, Sufen; Liang, Feng; Yang, Cheng-Fu
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 52
Record Type:: Journal Article
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9. Phase formation and microstructure evolution in Cu/In/Cu joints. (April 2019)

Authors:: Chiu, Y.S.; Yu, H.Y.; Hung, H.T.; Wang, Y.W.; Kao, C.R.
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 18
Record Type:: Journal Article
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10. Reliability and lifetime estimations of GaN-on-GaN vertical pn diodes. (April 2019)

Authors:: Rackauskas, B.; Uren, M.J.; Kachi, T.; Kuball, M.
Journal:: Microelectronics and reliability
Issue:: Volume 95(2019)
Page Start:: 48
Record Type:: Journal Article
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