A mechanistic model of damage evolution in lead free solder joints under combinations of vibration and thermal cycling with varying amplitudes. (April 2019)
- Record Type:
- Journal Article
- Title:
- A mechanistic model of damage evolution in lead free solder joints under combinations of vibration and thermal cycling with varying amplitudes. (April 2019)
- Main Title:
- A mechanistic model of damage evolution in lead free solder joints under combinations of vibration and thermal cycling with varying amplitudes
- Authors:
- Borgesen, P.
Wentlent, L.
Alghoul, T.
Sivasubramony, R.
Yadav, M.
Thekkut, S.
Cuevas, J.L. Then
Greene, C. - Abstract:
- Abstract: A broad range of electronics applications involve the long-term exposure to combinations of thermal excursions and vibration with constantly varying amplitudes, and the ultimate life is very often limited by fatigue of the solder joints. The assessment of this is usually based on a combination of simplified accelerated tests and the assumption of simple acceleration factor expressions or models. Neither of the latter can, however, even account for observed effects of accelerated test parameters. To make matters worse common constitutive relations may be strongly misleading. Also, current damage accumulation rules cannot account for major interactions between thermal cycling and vibration or even just for ongoing variations in vibration amplitudes or thermal cycling parameters, respectively. Even if we are 'just' aiming to decide between alternative material, design, or process parameters, or to compare a new product to a previous (supposedly similar) one, we should be concerned with the relative performance in service and not just in accelerated tests. The main objective of the present work is to combine two recent mechanistic models into a more comprehensive one that includes interactions between effects of thermal cycling and vibration with varying amplitudes. Important parameters in the resulting model still remain to be determined but a detailed understanding of the underlying mechanisms and the consequences of their interactions for realistic Tin-Silver-CopperAbstract: A broad range of electronics applications involve the long-term exposure to combinations of thermal excursions and vibration with constantly varying amplitudes, and the ultimate life is very often limited by fatigue of the solder joints. The assessment of this is usually based on a combination of simplified accelerated tests and the assumption of simple acceleration factor expressions or models. Neither of the latter can, however, even account for observed effects of accelerated test parameters. To make matters worse common constitutive relations may be strongly misleading. Also, current damage accumulation rules cannot account for major interactions between thermal cycling and vibration or even just for ongoing variations in vibration amplitudes or thermal cycling parameters, respectively. Even if we are 'just' aiming to decide between alternative material, design, or process parameters, or to compare a new product to a previous (supposedly similar) one, we should be concerned with the relative performance in service and not just in accelerated tests. The main objective of the present work is to combine two recent mechanistic models into a more comprehensive one that includes interactions between effects of thermal cycling and vibration with varying amplitudes. Important parameters in the resulting model still remain to be determined but a detailed understanding of the underlying mechanisms and the consequences of their interactions for realistic Tin-Silver-Copper (SnAgCu) joints allows for the prevention of surprises, the definition of appropriate test protocols, and the proper interpretation of results. This includes the identification of 'worst case' real life scenarios to test for, as well as justification for the use of shear testing in thermal cycling when event detection is not an option. Extension of the model to new alloys is briefly discussed as well. … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 95(2019)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 95(2019)
- Issue Display:
- Volume 95, Issue 2019 (2019)
- Year:
- 2019
- Volume:
- 95
- Issue:
- 2019
- Issue Sort Value:
- 2019-0095-2019-0000
- Page Start:
- 65
- Page End:
- 73
- Publication Date:
- 2019-04
- Subjects:
- Thermal cycling -- Vibration -- SnAgCu -- SnBi
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2019.02.001 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 9672.xml