Is Part Of: Microelectronics and reliability. Volume 91(2018)Part 1 - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 91(2018)Part 1

1. A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study. (December 2018)

Authors:: Pugalenthi, Karkulali; Raghavan, Nagarajan
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 160
Record Type:: Journal Article
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2. A robust asynchronous 16 × 16-bit subthreshold multiplier using SAPTL technique. (December 2018)

Authors:: Zhang, Qi; Wu, Yuping; Chen, Lan; Zhang, Xuelian
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 98
Record Type:: Journal Article
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3. Adhesion strength of die attach film for thin electronic package at elevated temperature. (December 2018)

Authors:: Mose, Bruno R.; Son, In-Seo; Shin, Dong-Kil
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 15
Record Type:: Journal Article
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4. Analytical model for the transient analysis of electronic assemblies subjected to impact loading. (December 2018)

Authors:: Gharaibeh, Mohammad A.; Su, Quang T.; Pitarresi, James M.
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 112
Record Type:: Journal Article
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5. Editorial Board. (December 2018)

Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: ii
Record Type:: Journal Article
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6. Failure and failure characterization of QFP package interconnect structure under random vibration condition. (December 2018)

Authors:: Jiaxing, Hu; Bo, Jing; Zengjin, Sheng; Fang, Lu; Yaojun, Chen; Yulin, Zhang
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 120
Record Type:: Journal Article
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7. Heavy ion impact on narrow band cascoded low noise amplifier. (December 2018)

Authors:: Rajendiran, P.; Srinivasan, R.
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 31
Record Type:: Journal Article
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8. Implications of electron beam irradiation on Al/n-Si Schottky junction properties. (December 2018)

Authors:: Vali, Indudhar Panduranga; Shetty, Pramoda Kumara; Mahesha, M.G.; Petwal, V.C.; Dwivedi, Jishnu; Phase, D.M.; Choudhary, R.J.
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 179
Record Type:: Journal Article
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9. Lifetime-aware scheduling in high level synthesis. (December 2018)

Authors:: Es'haghi, Siavash; Eshghi, Mohammad
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 86
Record Type:: Journal Article
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10. Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs. (December 2018)

Authors:: Zubert, Mariusz; Raszkowski, Tomasz; Samson, Agnieszka; Zając, Piotr
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 139
Record Type:: Journal Article
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