Is Part Of: Microelectronics and reliability. Volume 140(2023) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 140(2023)

1. A shared page-aware machine learning assisted method for predicting and improving multi-level cell NAND flash memory life expectancy. (January 2023)

Authors:: Santikellur, Pranesh; Buddhanoy, Matchima; Sakib, Sadman; Ray, Biswajit; Chakraborty, Rajat Subhra
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. An SEU-hardened ternary SRAM design based on efficient ternary C-elements using CNTFET technology. (January 2023)

Authors:: Bakhtiary, Vahid; Amirany, Abdolah; Moaiyeri, Mohammad Hossein; Jafari, Kian
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Degradation monitoring of SiC MOSFET gate-oxide based on differential mode conducted interference spectrum. (January 2023)

Authors:: Du, Mingxing; Yang, Guixu; Ren, Zhihui; Chu, Chengpeng
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. Design of compact-diode-SCR with low-trigger voltage for full-chip ESD protection. (January 2023)

Authors:: Gao, Yuexin; Cai, Xiaowu; Han, Zhengsheng; Zeng, Chuanbin; Xia, Ruirui; Tang, Yun; Gao, Mali; Li, Bo
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Editorial Board. (January 2023)

Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Effect of Sb content on the phase structure and interface structure of Sn1.0Ag0.5Cu lead-free solder. (January 2023)

Authors:: Xu, Fengxian; Zhu, Wenjia; Yan, Jikang; Zhao, Lingyan; Lv, Jinmei
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Influence analysis of joint attributes on the fatigue progress of SnAgCu solder joints under thermomechanical loading. (January 2023)

Authors:: Berger, Rika; Schwerz, Robert; Röllig, Mike; Heuer, Henning
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. Investigation of the dielectric properties of Au/Bi4Ti3O12-SiO2/n-Si (MFIS) type structures depending on gamma-irradiation. (January 2023)

Authors:: Baydilli, Esra Evcin
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Mechanisms and shielding characteristics of alpha particle-induced soft errors in 28 and 40 nm configuration memories of SRAM-based FPGAs. (January 2023)

Authors:: Luo, Jun-Yang; Zhang, Hong; Zhang, Zhan-Gang; Lei, Zhi-Feng; Guo, Jin-Long; Du, Guang-Hua; Peng, Chao; He, YuJuan; Zhong, Xiang-Li
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Novel radiation-hardened SRAM for immune soft-error in space-radiation environments. (January 2023)

Authors:: Zhao, Qiang; Dong, Hanwen; Wang, Xiuying; Hao, Licai; Peng, Chunyu; Lin, Zhiting; Wu, Xiulong
Journal:: Microelectronics and reliability
Issue:: Volume 140(2023)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗