Is Part Of: Microelectronics and reliability. Volume 137(2022) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 137(2022)

1. 50 MeV lithium ion irradiation studies on silicon-germanium heterojunction bipolar transistors at low temperature. (October 2022)

Authors:: Hegde, Vinayakprasanna N.; Praveen, K.C.; Pradeep, T.M.; Cressler, John D.; Prakash, A.P. Gnana
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. `Failure analysis of short-circuit failure of metal-oxide-metal capacitor. (October 2022)

Authors:: Wang, Yan; Zhu, Qingguo; Huang, Caiqing
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. A feasibility study on potential of stress sensors to detect solder joint defects toward prognostics of power modules. (October 2022)

Authors:: Usui, Masanori; Kuwahara, Makoto; Satoh, Toshikazu
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. A general approach for degradation modeling to enable a widespread use of aging simulations in IC design. (October 2022)

Authors:: Lange, André; Gonzalez, Fabio A. Velarde; Giering, Kay-Uwe; Vervantidis, Anastasios; Hahne, Lukas; Heinig, Andy; Jancke, Roland
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Aluminium corrosion in power semiconductor devices. (October 2022)

Authors:: Leppänen, J.; Ingman, J.; Peters, J.-H.; Hanf, M.; Ross, R.; Koopmans, G.; Jormanainen, J.; Forsström, A.; Ross, G.; Kaminski, N.; Vuorinen, V.
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Analysis of the stress state in QFN package during four point bending and temperature experiments utilizing piezoresistive stress sensor. (October 2022)

Authors:: Riegel, Daniel; Gromala, Przemyslaw Jakub; Rzepka, Sven
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET. (October 2022)

Authors:: Alberton, Saulo G.; Aguiar, V.A.P.; Medina, N.H.; Added, N.; Macchione, E.L.A.; Menegasso, R.; Cesário, G.J.; Santos, H.C.; Scarduelli, V.B.; Alcántara-Núñez, J.A.; Guazzelli, M.A.; Santos, R.B.B.; Flechas, D.
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. Corrigendum to "Wettable flank routable thin MicroLeadFrame for automotive applications" [Microelectron. Reliab. 135 (2022) 114602]. (October 2022)

Authors:: Kim, Byong Jin; Jeon, HyeongIl; Kim, GiJeong; Cho, Nam-Hee; Khim, JinYoung; Kim, Yeong K.
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. DC and RF/analog performances of split source horizontal pocket and hetero stack TFETs considering interface trap charges: A simulation study. (October 2022)

Authors:: Tiwari, Shreyas; Saha, Rajesh
Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Editorial Board. (October 2022)

Journal:: Microelectronics and reliability
Issue:: Volume 137(2022)
Page Start:
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗