Is Part Of: Microelectronics and reliability. Volume 122(2021) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 122(2021)

1. A simulation-based analysis of effect of interface trap charges on dc and analog/HF performances of dielectric pocket SOI-Tunnel FET. (July 2021)

Authors:: Pandey, Chandan K.; Singh, A.; Chaudhury, S.
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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2. CNN weight sharing based on a fast accuracy estimation metric. (July 2021)

Authors:: Dupuis, Etienne; Novo, David; O'Connor, Ian; Bosio, Alberto
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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3. Degraded power MOSFET effects on Class-A power amplifier: Modelling studies considering feedback. (July 2021)

Authors:: Meydanci, Mehmet Akif; Özçelep, Yasin
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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4. Design of analog nonlinear transformations based on a Gilbert multiplier for energy detection. (July 2021)

Authors:: Vauche, R.; Benjelloun, Z.; Assila, R. Belhadj Mefteh; Rahajandraibe, W.; Bouchakour, R.; Barthelemy, H.
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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5. Editorial Board. (July 2021)

Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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6. Effect of high current pulses on solder interfacial reaction and interconnect reliability. (July 2021)

Authors:: Mei, J.; Haug, R.; Grözinger, T.; Zimmermann, A.
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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7. Effect of intrinsic PCB parameters on the performance of fluoropolymer coating under condensing humidity conditions. (July 2021)

Authors:: Mantis, Ioannis; Li, Feng; Jellesen, Morten Stendahl; Ambat, Rajan
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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8. Effect of thermo-mechanical ageing on materials and interface properties in flexible microelectronic devices. (July 2021)

Authors:: Chapel, Anthony; Fortineau, Jérôme; Porcher, Nicolas; Malandain, Simon; Boucaud-Gauchet, Séverine
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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9. High-level fault injection to assess FMEA on critical systems. (July 2021)

Authors:: Roux, Julie; Beroulle, Vincent; Morin-Allory, Katell; Leveugle, Régis; Bossuet, Lilian; Cézilly, Frédéric; Berthoz, Frédéric; Genévrier, Gilles; Cerisier, François
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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10. Influence of power cycling ageing on the current and voltage transitions during hard switching of IGBT devices. (July 2021)

Authors:: Deng, Erping; Liu, Xing; Seidel, Peter; Chen, Jie; Lutz, Josef
Journal:: Microelectronics and reliability
Issue:: Volume 122(2021)
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Record Type:: Journal Article
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