Influence of power cycling ageing on the current and voltage transitions during hard switching of IGBT devices. (July 2021)

• Record Type: Journal Article
• Authors: Deng, Erping; Liu, Xing; Seidel, Peter; Chen, Jie; Lutz, Josef
• Is Part Of: Microelectronics and reliability. Volume 122(2021)
• Publication Date: 2021-07
• Subjects: IGBT -- Power cycling lifetime -- Switching behavior; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2021.114161
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: In this paper, the influence of ageing by PCT (Power Cycling Test) on the hard switching behavior of IGBT (Insulated Gate Bipolar Transistor) devices, especially the current change rate d i /d t and voltage change rate d v /d t during the switching process, is investigated with standard DC-PCT and a PCT with superimposed switching losses. 1200 V IGBTs with two different package forms are used for the PCTs to stimulate two common failure modes: discrete devices with the bond wire failures and modules without baseplate to trigger the solder layer degradation. To evaluate the hard switching behavior of the IGBTs, a DPT (double pulse test) is repetitively performed after a specific number of cycles at the same test conditions to determine the influence of power cycling ageing. The experimental results show that the current and voltage transient transitions of IGBT devices during hard switching are independent of the power cycling ageing. Highlights: No effects on the di/dt and dv/dt of IGBT devices after power cycling ageing was found. Either the bond wire failure or solder layer degradation has very less influence. The influence of package ageing and temperature has been decoupled. The di/dt and dv/dt can possibly be used as temperature indicators for converter but not in power cycling.