Date: 2019 / Subject: Integrated circuits -- Very large scale integration -- Testing - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Date 2019 Subject Integrated circuits -- Very large scale integration -- Testing

1. Test generation of crosstalk delay faults in VLSI circuits. ([2019])

Authors:: Jayanthy, S; Bhuvaneswari, M. C
Record Type:: Book
Extent:: 1 online resource (xi, 156 pages), illustrations (some color)
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2. VLSI design and test for systems dependability. ([2019])

Editors:: Asai, Shojiro
Record Type:: Book
Extent:: 1 online resource
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗