Journal: Solid-state electronics / Issue: Volume 113(2015) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Solid-state electronics Issue Volume 113(2015)

1. A high-sensitivity 135 GHz millimeter-wave imager by compact split-ring-resonator in 65-nm CMOS. (November 2015)

Authors:: Li, Nan; Yu, Hao; Yang, Chang; Shang, Yang; Li, Xiuping; Liu, Xiong
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 54
Record Type:: Journal Article
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2. A quasi 2D semianalytical model for the potential profile in hetero and homojunction tunnel FETs. (November 2015)

Authors:: Villani, F.; Gnani, E.; Gnudi, A.; Reggiani, S.; Baccarani, G.
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 86
Record Type:: Journal Article
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3. Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk. (November 2015)

Authors:: Carrillo-Nuñez, Hamilton; Luisier, Mathieu; Schenk, Andreas
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 61
Record Type:: Journal Article
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4. Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: Experimental data and numerical simulation. (November 2015)

Authors:: Marino, F.A.; Bisi, D.; Meneghini, M.; Verzellesi, G.; Zanoni, E.; Van Hove, M.; You, S.; Decoutere, S.; Marcon, D.; Stoffels, S.; Ronchi, N.; Meneghesso, G.
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 9
Record Type:: Journal Article
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5. Compact model for parametric instability under arbitrary stress waveform. (November 2015)

Authors:: Alagi, Filippo; Rossetti, Mattia; Stella, Roberto; Viganò, Emanuele; Raynaud, Philippe
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 92
Record Type:: Journal Article
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6. Dual Ground Plane EDMOS in 28 nm FDSOI for 5 V power management applications. (November 2015)

Authors:: Litty, Antoine; Ortolland, Sylvie; Golanski, Dominique; Cristoloveanu, Sorin
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 42
Record Type:: Journal Article
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7. Editorial Board. (November 2015)

Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: IFC
Record Type:: Journal Article
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8. Editorial Board. (November 2015)

Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: IFC
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Experimental demonstration of improved analog device performance of nanowire-TFETs. (November 2015)

Authors:: Schulte-Braucks, Christian; Richter, Simon; Knoll, Lars; Selmi, Luca; Zhao, Qing-Tai; Mantl, Siegfried
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 179
Record Type:: Journal Article
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10. Extraction of roughness parameters at nanometer scale by Monte Carlo simulation of Critical Dimension Scanning Electron Microscopy. (November 2015)

Authors:: Ciappa, M.; Ilgünsatiroglu, E.; Illarionov, A.Yu.
Journal:: Solid-state electronics
Issue:: Volume 113(2015)
Page Start:: 73
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗