1. 3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Mongeon, Stephen; Fu, Bianzhu; Chen, Esther (PY); Flatoff, Daniel; LaManque, Nicolas; Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. 3D Analytical TEM Approach to Effectively Characterize 3D-FinFET Device Features in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Mongeon, Stephen; Fu, Bianzhu; Chen, Esther (PY); Flatoff, Daniel; LaManque, Nicolas; Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A Best Known Method to Effectively Differentiate Elements with XEDS Peaks Overlapping for High-Volume Manufacturing of Semiconductor Device at Wafer Foundries. (August 2021) Authors: Zhao, Wayne Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 3154 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. An Approach to Extend Electron Holography into Characterization on Dopant Profiles for FinFET of Nanometer Semiconductor Device in Wafer-foundries. (August 2020) Authors: Zhao, Wayne; Mitchell, Travis Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1412 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. An Observation and Hypothesis for Gate Leakage Mechanism in FinFET Transistor Semiconductor Device from Dies near Wafer Extreme Edge. (August 2021) Authors: Zhao, Wayne Journal: Microscopy and microanalysis Issue: Volume 27:Supplement 1(2021) Page Start: 2306 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Porter, Hugh; Rai, Raghaw; Chen, Esther (PY); Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1000 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Beware of Artifacts When Characterizing Nanometer Device Features Smaller than a TEM Lamella Thickness in Semiconductor Wafer-foundries. (August 2014) Authors: Zhao, Wayne; Porter, Hugh; Rai, Raghaw; Chen, Esther (PY); Russell, Jeremy Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1000 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Challenges in Characterizations of MTJ Thin Film Stack for Spin-transfer Torque MRAM Device by Analytical TEM in Wafer-foundries. (August 2020) Authors: Zhao, Wayne; Dixit, Hemant; Mitchell, Travis; Taylor, William Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 2820 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Development of Ultra-thin TEM Lamella Preparation Technique and Its Application in Failure Analysis. (August 2020) Authors: Zhang, Yu; Popielarski, Brian; Davidson, Kevin; Men, Long; Zhao, Wayne; Baumann, Frieder Journal: Microscopy and microanalysis Issue: Volume 26:(2020)Supplement 2 Page Start: 1400 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Exploring demographic information in social media for product recommendation. Issue 1 (October 2016) Authors: Zhao, Wayne; Li, Sui; He, Yulan; Wang, Liwei; Wen, Ji-Rong; Li, Xiaoming Journal: Knowledge and information systems Issue: Volume 49:Issue 1(2016:Oct.) Page Start: 61 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗