1. Anisotropic Biaxial Strain Evaluation in Carbon-Doped Silicon Using Water-Immersion Raman Spectroscopy. (3rd July 2019) Authors: Yoshioka, Kazutoshi; Yokogawa, Ryo; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 92:Number 4(2019) Page Start: 33 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Crystallinity Evaluation of Low Temperature Polycrystalline Silicon Thin Film Using UV/Visible Raman Spectroscopy. (4th May 2016) Authors: Yokogawa, Ryo; Takahashi, Kazuya; Komori, Katsuhiko; Hirota, Yoshihiro; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 72:Number 4(2016) Page Start: 249 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Determination of Phonon Deformation Potentials in Carbon-Doped Silicon. (20th July 2018) Authors: Yoshioka, Kazutoshi; Yokogawa, Ryo; Murakami, Tatsumi; Komago, Shota; Sawamoto, Naomi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 419 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Effect of sawing damage on flexibility of crystalline silicon wafers for thin flexible silicon solar cells. (1st January 2023) Authors: Hara, Yutaka; Ide, Koki; Nishihara, Tappei; Yokogawa, Ryo; Nakamura, Kyotaro; Ohshita, Yoshio; Kawatsu, Tomoyuki; Nagai, Toshiki; Aoki, Yuma; Kobayashi, Hayato; Yamada, Noboru; Miyashita, Yukio; Ogura, Atsushi Journal: Japanese journal of applied physics Issue: Volume 62:Number 1(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Evaluation of Anisotropic Biaxial Stress in Si1-XGex/Ge Mesa-Structure by Oil-Immersion Raman Spectroscopy. (31st March 2015) Authors: Yamamoto, Shotaro; Takeuchi, Kazuma; Yokogawa, Ryo; Tomita, Motohiro; Kosemura, Daisuke; Usuda, Koji; Ogura, Atsushi Journal: ECS transactions Issue: Volume 66:Number 4(2015) Page Start: 39 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Evaluation of Anisotropic Three-Dimensional Strain Relaxation in Stripe-Shaped Ge1-xSnx Mesa Structure. (20th July 2018) Authors: Takahashi, Yuki; Yokogawa, Ryo; Murakami, Tatsumi; Hirosawa, Ichiro; Suda, Kohei; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 329 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Evaluation of controlled strain in silicon nanowire by UV Raman spectroscopy. (22nd May 2017) Authors: Yokogawa, Ryo; Hashimoto, Shuichiro; Asada, Shuhei; Tomita, Motohiro; Watanabe, Takanobu; Ogura, Atsushi Journal: Japanese journal of applied physics Issue: Volume 56:Number 6(2017)Supplement 1 Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Evaluation of Laterally Graded Silicon Germanium Wires for Thermoelectric Devices Fabricated by Rapid Melting Growth. (20th July 2018) Authors: Yokogawa, Ryo; Hashimoto, Shuichiro; Takahashi, Kouta; Oba, Shunsuke; Tomita, Motohiro; Kurosawa, Masashi; Watanabe, Takanobu; Ogura, Atsushi Journal: ECS transactions Issue: Volume 86:Number 7(2018) Page Start: 87 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Evaluation of Phonon Dispersion Relation for Bulk Silicon Germanium by Inelastic X-ray Scattering. (8th September 2020) Authors: Yokogawa, Ryo; Takeuchi, Haruki; Arai, Yasutomo; Yonenaga, Ichiro; Uchiyama, Hiroshi; Ogura, Atsushi Journal: ECS transactions Issue: Volume 98:Number 5(2020) Page Start: 465 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Evaluation of Silicon Nitride Film Formed by Atomic Layer Deposition on the Silicon Substrate with Trench Structure Using Angle-Resolved Hard X-ray Photoelectron Spectroscopy. (8th September 2020) Authors: Nishihara, Tapei; Yokogawa, Ryo; Otsuki, Yuji; Kagaya, Munehito; Ogura, Atsushi Journal: ECS transactions Issue: Volume 98:Number 3(2020) Page Start: 113 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗