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1. Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. (22nd March 2019)

2. Comparison between simulated and observed LHC beam backgrounds in the ATLAS experiment at Ebeam=4 TeV. (4th December 2018)

3. Modelling radiation damage to pixel sensors in the ATLAS detector. (11th June 2019)

4. Development of n+-in-p planar pixel quadsensor flip-chipped with FE-I4 readout ASICs. (30th January 2017)

6. Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam. (29th July 2016)

7. Investigations into the impact of locally modified sensor architectures on the detection efficiency of silicon micro-strip sensors. (5th July 2017)

8. Pre-production results from ATLAS ITk Strip Sensors Quality Assurance Testchip. (1st November 2022)

9. ATLAS ITk strip sensor quality control procedures and testing site qualification. (1st December 2022)