Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. (22nd March 2019)

Record Type:: Journal Article
Title:: Mapping the depleted area of silicon diodes using a micro-focused X-ray beam. (22nd March 2019)
Main Title:: Mapping the depleted area of silicon diodes using a micro-focused X-ray beam
Authors:: Poley, L.
Blue, A.
Bloch, I.
Buttar, C.
Fadeyev, V.
Fernandez-Tejero, J.
Fleta, C.
Hacker, J.
Llacer, C. Lacasta
Miñano, M.
Renzmann, M.
Rossi, E.
Sawyer, C.
Sperlich, D.
Stegler, M.
Ullán, M.
Unno, Y.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 14:Number 3(2019)
Journal:: Journal of instrumentation
Issue:: Volume 14:Number 3(2019)
Issue Display:: Volume 14, Issue 3 (2019)
Year:: 2019
Volume:: 14
Issue:: 3
Issue Sort Value:: 2019-0014-0003-0000
Page Start:: P03024
Page End:: P03024
Publication Date:: 2019-03-22
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/14/03/P03024 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 10114.xml