1. Correlation between crystal warpage and swelling of 4H-SiC through implantation and annealing. (27th August 2020) Authors: Ishiji, Kotaro; Sato, Kiichi; Fujii, Takashi; Araki, Tsutomu; Mouri, Shinichiro; Sugie, Ryuichi Journal: Semiconductor science and technology Issue: Volume 35:Number 10(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Detailed analysis of Ga-rich current pathways created in an n-Al0.7Ga0.3N layer grown on an AlN template with dense macrosteps. (30th November 2020) Authors: Nagasawa, Yosuke; Hirano, Akira; Ippommatsu, Masamichi; Sako, Hideki; Hashimoto, Ai; Sugie, Ryuichi; Honda, Yoshio; Amano, Hiroshi; Akasaki, Isamu; Kojima, Kazunobu; Chichibu, Shigefusa F. Journal: Applied physics express Issue: Volume 13:Number 12(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Direct growth of GaN film on ScAlMgO4 substrate by radio-frequency plasma-excited molecular beam epitaxy. (15th February 2023) Authors: Araki, Tsutomu; Kayamoto, Seiya; Wada, Yuuichi; Kuroda, Yuuya; Nakayama, Daiki; Goto, Naoki; Deura, Momoko; Mouri, Shinichiro; Fujii, Takashi; Fukuda, Tsuguo; Shiraishi, Yuuji; Sugie, Ryuichi Journal: Applied physics express Issue: Volume 16:Number 2(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Discrete wavelengths observed in electroluminescence originating from Al1/2Ga1/2N and Al1/3Ga2/3N created in nonflat AlGaN quantum wells. (7th September 2021) Authors: Nagasawa, Yosuke; Kojima, Kazunobu; Hirano, Akira; Sako, Hideki; Hashimoto, Ai; Sugie, Ryuichi; Ippommatsu, Masamichi; Honda, Yoshio; Amano, Hiroshi; Chichibu, Shigefusa F Journal: Journal of physics Issue: Volume 54:Number 48(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Low-energy cross-sectional cathodoluminescence analysis of the depth distribution of point defects in Si-ion-implanted β-Ga2O3. (23rd November 2020) Authors: Sugie, Ryuichi; Uchida, Tomoyuki; Hashimoto, Ai; Akahori, Seishi; Matsumura, Koji; Tanii, Yoshiharu Journal: Applied physics express Issue: Volume 13:Number 12(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Measurement of the properties of GaN layers using terahertz time‐domain spectroscopic ellipsometry. Issue 8 (17th July 2017) Authors: Tachi, Kohei; Asagami, Shiho; Fujii, Takashi; Araki, Tsutomu; Nanishi, Yasushi; Nagashima, Takeshi; Iwamoto, Toshiyuki; Sato, Yukinori; Morita, Naotake; Sugie, Ryuichi; Kamiyama, Satoshi Journal: Physica status solidi Issue: Volume 254:Issue 8(2017) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Minority-carrier dynamics in β-gallium oxide probed by depth-resolved cathodoluminescence. (23rd September 2022) Authors: Sugie, Ryuichi; Uchida, Tomoyuki Journal: Journal of physics Issue: Volume 55:Number 46(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Optical discrimination of threading dislocations in 4H-SiC epitaxial layer by phase-contrast microscopy. (6th June 2018) Authors: Hattori, Ryo; Oku, Osamu; Sugie, Ryuichi; Murakami, Kazutsugu; Kuzuhara, Masaaki Journal: Applied physics express Issue: Volume 11:Number 7(2018) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Theoretical and experimental Raman study for mechanical stress in die-attach process. (June 2021) Authors: Uchida, Tomoyuki; Masuyama, Takumi; Sugie, Ryuichi; Watanabe, Satoshi Journal: Microelectronics and reliability Issue: Volume 121(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Thermal stress analysis in die-attached β-Ga2O3 using Raman spectroscopy. (1st June 2023) Authors: Uchida, Tomoyuki; Sugie, Ryuichi Journal: Japanese journal of applied physics Issue: Volume 62:Number SF(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗