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6. Near‐Surface Defect Control by Vacancy Injecting/Out‐Diffusing Rapid Thermal Annealing. Issue 17 (5th August 2019)

8. Simulation of Nitrogen Indiffusion and Its Impact on Silicon Wafer Strength. Issue 23 (30th July 2021)

9. Study on defect annealing potential and bulk micro defect formation using high temperature RTA conditions for Cz‐grown silicon. Issue 7 (21st June 2017)