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2. Anisotropic radius of curvature of crystal planes in wide-bandgap semiconductor wafers measured by X-ray diffraction. (2nd December 2021)

5. Crystal defects observed by the etch-pit method and their effects on Schottky-barrier-diode characteristics on β-Ga2O3. (28th July 2017)

10. Electrical properties of Schottky barrier diodes fabricated on (001) β-Ga2O3 substrates with crystal defects. (30th June 2017)